Instruct: Identify the main and secondary category of Arxiv papers based on the titles and abstracts
Query: Measurement of specific contact resistivity using scanning voltage
  probes   Specific contact resistivity measurements have conventionally been heavy in
both fabrication and simulation/calculation in order to account for complicated
geometries and other effects such as parasitic resistance. We propose a simpler
geometry to deliver current, and the use of a scanning voltage probe to sense
the potential variation along the sample surface, from which the specific
contact resistivity can be straightforwardly deduced. We demonstrate an
analytical example in the case where both materials are thin films.
Experimental data with a scanning Kelvin probe measurement on graphene from the
literature corroborates our model calculation.

20
The categories of this paper are: acc-phys
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The categories of this paper are: eess
12
The categories of this paper are: nucl-th
13
The categories of this paper are: quant-ph
9
The categories of this paper are: nlin
24
The categories of this paper are: dg-ga
11
The categories of this paper are: hep-lat
21
The categories of this paper are: adap-org
6
The categories of this paper are: astro-ph
29
The categories of this paper are: funct-an
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The categories of this paper are: comp-gas
16
The categories of this paper are: stat
35
The categories of this paper are: mtrl-th
32
The categories of this paper are: atom-ph
25
The categories of this paper are: patt-sol
8
The categories of this paper are: hep-ex