candidate: AFM , atomic force microscopy BEEM , ballistic electron emission microscopy EFM , electrostatic force microscope ESTM electrochemical scanning tunneling microscope FMM , force modulation microscopy KPFM , kelvin probe force microscopy MFM , magnetic force microscopy MRFM , magnetic resonance force microscopy NSOM , near - field scanning optical microscopy ( or SNOM , scanning near - field optical microscopy ) PFM , piezo force microscopy PSTM , photon scanning tunneling microscopy PTMS , photothermal microspectroscopy / microscopy SAP , scanning atom probe SCM , scanning capacitance microscopy SECM , scanning electrochemical microscopy SGM , scanning gate microscopy SICM , scanning ion - conductance microscopy SPSM spin polarized scanning tunneling microscopy SThM , scanning thermal microscopy STM , scanning tunneling microscopy SVM , scanning voltage microscopy SHPM , scanning Hall probe microscopy SSM , Scanning SQUID microscope RTM , Recurrence tracking microscope Scanning probe .