The low-energy electron point source microscope as a tool for transport   measurements of free-standing nanometer scale objects: application to carbon   nanotubes
  We have developed a simple and reliable technique for two-terminal transport measurements of free-standing wire-like objects. The method is based on the low-energy electron point source microscope. The field emission tip of the microscope is used as a movable electrode to make a well-defined local electrical contact on a controlled place of a nanometer-size object. This allows transport measurements of the object to be conducted. The technique was applied to carbon nanotube ropes. 
P. Dorozhkin, H. Nejoh, D. Fujita