Defect-induced perturbations of atomic monolayers on solid surfaces
  We study long-range morphological changes in atomic monolayers on solid substrates induced by different types of defects; e.g., by monoatomic steps in the surface, or by the tip of an atomic force microscope (AFM), placed at some distance above the substrate. Representing the monolayer in terms of a suitably extended Frenkel-Kontorova-type model, we calculate the defect-induced density profiles for several possible geometries. In case of an AFM tip, we also determine the extra force exerted on the tip due to the tip-induced de-homogenization of the monolayer. 
H. Schiessel, G. Oshanin, A. M. Cazabat and M. Moreau