Speed up the generation of storage format test cases
Speed up the generation of storage format test cases

First build a list of all keys, then construct all the corresponding
test cases. This allows all required information to be obtained in
one go, which is a significant performance gain as the information
includes numerical values obtained by compiling a C program.

Signed-off-by: Gilles Peskine <f805f64266d288fc5467baa7be6cd0ff366f477b@arm.com>

ARMmbed/mbedtls,Mbed-TLS/mbedtls,ARMmbed/mbedtls,Mbed-TLS/mbedtls,NXPmicro/mbedtls,Mbed-TLS/mbedtls,ARMmbed/mbedtls,Mbed-TLS/mbedtls,NXPmicro/mbedtls,ARMmbed/mbedtls,NXPmicro/mbedtls,NXPmicro/mbedtls