USB: keyspan: remove bogus disconnect test in close
USB: keyspan: remove bogus disconnect test in close

Remove bogus (and unnecessary) test for serial->dev being NULL in close.

The device is never cleared, and close is never called after a completed
disconnect anyway.

Remove some out-commented bogus code while at it.

Signed-off-by: Johan Hovold <6a430eed381e126d51a8cce8db662f765ce314bc@gmail.com>
Signed-off-by: Greg Kroah-Hartman <4645f7897fd33786a2ee1264d590b3c400559d85@linuxfoundation.org>

TeamVee-Kanas/android_kernel_samsung_kanas,TeamVee-Kanas/android_kernel_samsung_kanas,KristFoundation/Programs,KristFoundation/Programs,KristFoundation/Programs,KristFoundation/Programs,TeamVee-Kanas/android_kernel_samsung_kanas,KristFoundation/Programs,TeamVee-Kanas/android_kernel_samsung_kanas,KristFoundation/Programs,TeamVee-Kanas/android_kernel_samsung_kanas